Posted by Yunfei (220.127.116.11) on December 16, 2009 at 07:10:09:
Thank you very much for the former answer. I have another question. For the emitter profile, it is said SIMS give you the atom concentraion distribution along the depth, while SRP give you the electrically active concentraion. can you explain the difference between these two concentration. I will appreciate for directly communication by your email.